Optical behaviors of thin indium-containing chalcogenide films
Identifieur interne : 003B94 ( Main/Repository ); précédent : 003B93; suivant : 003B95Optical behaviors of thin indium-containing chalcogenide films
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Abstract
The optical spectra of thin (GeSe5)100-xlnx films, with x from 0 to 20 mol% indium, have been studied with a view to understanding the role of indium on the film behavior. An optical characterization method, based on the transmission and the reflection spectra at normal incidence of uniform, thin films, has been used to obtain the thicknesses and optical constants corresponding to the as-deposited and annealed samples. The dispersion of the refractive index is discussed in terms of the single-oscillator Wemple-Di Domenico model. The absorption edges are described using both the Urbach rule and the'nondirect transition' model proposed by Tauc. The variations in the refractive index, the bandgap, and the oscillation energy of the films after annealing are discussed with respect to rearrangement of the main structure units.
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Ohridski Blvd.</s1><s2>1756 Sofia</s2><s3>BGR</s3><sZ>1 aut.</sZ><sZ>2 aut.</sZ><sZ>3 aut.</sZ><sZ>4 aut.</sZ></inist:fA14><country>Bulgarie</country><placeName><settlement type="city">Sofia</settlement><region nuts="2">Sofia-ville (oblast)</region></placeName></affiliation></author><author><name sortKey="Nedeva, Y" uniqKey="Nedeva Y">Y. Nedeva</name><affiliation wicri:level="1"><inist:fA14 i1="01"><s1>Thin Films Technology Lab, Department of Physics, University of Chemical Technology and Metallurgy, 8 Kl. Ohridski Blvd.</s1><s2>1756 Sofia</s2><s3>BGR</s3><sZ>1 aut.</sZ><sZ>2 aut.</sZ><sZ>3 aut.</sZ><sZ>4 aut.</sZ></inist:fA14><country>Bulgarie</country><placeName><settlement type="city">Sofia</settlement><region nuts="2">Sofia-ville (oblast)</region></placeName></affiliation></author><author><name sortKey="Petkov, E" uniqKey="Petkov E">E. Petkov</name><affiliation wicri:level="1"><inist:fA14 i1="01"><s1>Thin Films Technology Lab, Department of Physics, University of Chemical Technology and Metallurgy, 8 Kl. Ohridski Blvd.</s1><s2>1756 Sofia</s2><s3>BGR</s3><sZ>1 aut.</sZ><sZ>2 aut.</sZ><sZ>3 aut.</sZ><sZ>4 aut.</sZ></inist:fA14><country>Bulgarie</country><placeName><settlement type="city">Sofia</settlement><region nuts="2">Sofia-ville (oblast)</region></placeName></affiliation></author></titleStmt><publicationStmt><idno type="inist">10-0427904</idno><date when="2010">2010</date><idno type="stanalyst">PASCAL 10-0427904 INIST</idno><idno type="RBID">Pascal:10-0427904</idno><idno type="wicri:Area/Main/Corpus">003D73</idno><idno type="wicri:Area/Main/Repository">003B94</idno></publicationStmt><seriesStmt><idno type="ISSN">0142-2421</idno><title level="j" type="abbreviated">Surf. interface anal.</title><title level="j" type="main">Surface and interface analysis</title></seriesStmt></fileDesc><profileDesc><textClass><keywords scheme="KwdEn" xml:lang="en"><term>Chalcogenide glasses</term><term>Energy gap</term><term>Indium</term><term>Thin films</term></keywords><keywords scheme="Pascal" xml:lang="fr"><term>Indium</term><term>Couche mince</term><term>Bande interdite</term><term>Verre chalcogénure</term><term>In</term></keywords></textClass></profileDesc></teiHeader><front><div type="abstract" xml:lang="en">The optical spectra of thin (GeSe<sub>5</sub>)<sub>100-x</sub>ln<sub>x</sub> films, with x from 0 to 20 mol% indium, have been studied with a view to understanding the role of indium on the film behavior. An optical characterization method, based on the transmission and the reflection spectra at normal incidence of uniform, thin films, has been used to obtain the thicknesses and optical constants corresponding to the as-deposited and annealed samples. The dispersion of the refractive index is discussed in terms of the single-oscillator Wemple-Di Domenico model. The absorption edges are described using both the Urbach rule and the'nondirect transition' model proposed by Tauc. 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Ohridski Blvd.</s1><s2>1756 Sofia</s2><s3>BGR</s3><sZ>1 aut.</sZ><sZ>2 aut.</sZ><sZ>3 aut.</sZ><sZ>4 aut.</sZ></fA14><fA15 i1="01"><s1>Department of Chemistry, Bilkent University</s1><s2>Ankara</s2><s3>TUR</s3><sZ>2 aut.</sZ></fA15><fA15 i1="02"><s1>The Surface Analysis Laboratory, University of Surrey</s1><s2>Guildford, Surrey GU2 7XH</s2><s3>GBR</s3><sZ>3 aut.</sZ></fA15><fA20><s1>1235-1238</s1></fA20><fA21><s1>2010</s1></fA21><fA23 i1="01"><s0>ENG</s0></fA23><fA43 i1="01"><s1>INIST</s1><s2>18260</s2><s5>354000193780181710</s5></fA43><fA44><s0>0000</s0><s1>© 2010 INIST-CNRS. All rights reserved.</s1></fA44><fA45><s0>16 ref.</s0></fA45><fA47 i1="01" i2="1"><s0>10-0427904</s0></fA47><fA60><s1>P</s1><s2>C</s2></fA60><fA61><s0>A</s0></fA61><fA64 i1="01" i2="1"><s0>Surface and interface analysis</s0></fA64><fA66 i1="01"><s0>GBR</s0></fA66><fC01 i1="01" l="ENG"><s0>The optical spectra of thin (GeSe<sub>5</sub>)<sub>100-x</sub>ln<sub>x</sub> films, with x from 0 to 20 mol% indium, have been studied with a view to understanding the role of indium on the film behavior. An optical characterization method, based on the transmission and the reflection spectra at normal incidence of uniform, thin films, has been used to obtain the thicknesses and optical constants corresponding to the as-deposited and annealed samples. The dispersion of the refractive index is discussed in terms of the single-oscillator Wemple-Di Domenico model. The absorption edges are described using both the Urbach rule and the'nondirect transition' model proposed by Tauc. 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